Jiwei Zhang focuses her practice on patent litigation and commercial litigation before U.S. district courts and the U.S. International Trade Commission. With her unique bilingual and educational background combined with extensive experience in litigation practice, Ms. Zhang represents and advises large and emerging companies in judicial and administrative proceedings. Her practical and first-hand experience benefits clients with different perspectives and unique needs. Ms. Zhang also counsels clients regarding intellectual property planning and strategies as well as license and award applications before U.S. government agencies.
Prior to joining Mei & Mark LLP, Ms. Zhang worked for law firms in New York City and China. While in law school, Ms. Zhang served as a judicial intern to Judge David C. Mason of the 22nd Judicial Circuit of Missouri in St. Louis.